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2019 32th IEEE International Conference on Microelectronic Test Structures
2019-03-18
Primarius，Inc. will attend the 32th IEEE International Conference on Microelectronic Test Structures（ICMTS）from March 18 to 21 in Fukuoka, Japan.
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SPICE ModelBaseband Modeling
? BSIMProPlus
RF Modeling
? MeQLab
Model Extraction Automation
? SDEP
Model QA
? ME-Pro
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PDKPCell Development
? PCellLab
PDK Verification
? PQLab
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Standard CellLibrary Characterization
? NanoCell
Library Validation
? LibWiz
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Design EnvironmentSchematic Capture
? NanoDesigner SE
Layout Editor
? NanoDesigner LS
Interactive Physical Verification
? NanoDesigner?iV
Design Optimization
? NanoDesigner?Optimizer
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Circuit SimulationSPICE Simulator
? NanoSpice ? NanoSpice X ? NanoSpice Giga
FastSPICE Simulator
? NanoSpice Pro ? NanoSpice Pro X
Mixed Signal
? NanoSpice MS
Waveform Analysis
? NanoWave
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Circuit Analysis
Static and Dynamic Circuit Check
? NanoSpice CCK
Yield Analysis
? NanoYield
Signal Integrity
? NanoSpice?SI
Critical Path Analysis
? PathInspector
Power Device Design Verification
? PTM
Power Distribution Network Analysis
ESD Verification
? ESDi
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Circuit SimulationDigital Simulation
? VeriSim
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Standard Cell
Library Characterization
? NanoCell
Library Validation
? LibWiz
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Design & VerificationTiming Analysis
? TRASTA
Floor Planning
? NavisPro
Signal Integrity Analysis
? NanoSpice SI
Power Design Analysis
? PTM
ESD Verification
? ESDi
Chip-to-Package Connectivity Verification
? PadInspector
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Parametric TestingSemiconductor Parametric Analyzer
? FS-Pro ? FS800
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Noise MeasurementLow Frequency Noise
? 9812DX ? 9812E ? 9813DXC
AC Dynamic Noise
? 9812AC
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Integrated Testing
Electrical Parameter Testing Software
? LabExpress
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